Microtechnology/Microelectromechanical Systems (MEMS)

From Wikibooks, open books for an open world
Jump to navigation Jump to search



Strain Gauges[edit]

Pressure Sensors[edit]

AFM cantilevers[edit]

Acceleration Detectors[edit]

Optical Beam Control[edit]

RF MEMS[edit]

Reliability design rules[edit]

Sandia has published a set of "reliability design rules" for MEMS devices intended to avoid failure modes experienced in early MEMS device tests. The most common failure mechanism was wear of the rubbing surfaces. [1]


See also notes on editing this book about how to add references Microtechnology/About#How to Contribute.

  1. Danelle M. Tanner et. al. "MEMS Reliability: Infrastructure, Test Structures, Experiments, and Failure Modes". Sandia. 2000.