Nanotechnology/STM
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Scanning Tunneling Microscopy[edit]

Basic overview of the scanning tunneling microscope tip-sample interaction. When the tip is within atomic distance of the sample surface and a small bias voltage about a volt or so is applied, tunneling current can be measured. Adjusting the height of the tip while scanning the tip over the surface with a fixed bias voltage to always maintain a constant tunnel current will map out the sample topography.
Tips for STM[edit]
- KOH etched tungsten tips
- PtIr tips
References[edit]
See also notes on editing this book about how to add references Nanotechnology/About#How_to_contribute.