File:DEPTHSandWIDTHS.png
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DEPTHSandWIDTHS.png (369 × 370 pixels, file size: 15 KB, MIME type: image/png)
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Summary
| Description | This figure illustrates the footprints of various observation tools in terms of transverse versus longitudinal field width and resolution. Tools for investigation on the nanoscale (light microscopes = LM, electron microscopes = EM, scanning probe microscopes = SPM) fall into the crossed yellow bands. |
| Date | |
| Source | Own work |
| Author | P. Fraundorf |
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 17:57, 31 January 2008 | | 369 × 370 (15 KB) | Unitsphere | {{Information |Description=This figure illustrates the footprints of various observation tools in terms of transverse versus longitudinal field width and resolution is concerned. |Source=self-made |Date=31 January 2008 |Author= P. Fraundorf |Permission=se |
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