File:AFM cantilever, detectors and angles.jpg
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AFM_cantilever,_detectors_and_angles.jpg (520 × 330 pixels, file size: 55 KB, MIME type: image/jpeg)
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Summary
| Description |
English: AFM cantilever, with deflection angles and detector setup.
The Z-deflection from the sample Z topography is giving a deflection in the xz-plane and measured by the top-bottom detector pair. Lateral forces on the cantilever give both torsion (yz-plane deflection and Left-right detector signal) and a lateral deflection in the xy-plane that cannot be measured by the detector. |
| Source | Please acknowledge the Opensource Handbook of Nanotechnology if you use illustrations from it. |
| Author | Illustration by Kristian Molhave |
Licensing
This file is licensed under the Creative Commons Attribution 2.5 Generic license.
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File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 11:58, 17 November 2006 | | 520 × 330 (55 KB) | KristianMolhave | AFM cantilever, with deflection angles and detector setup. The Z-deflection from the sample <math>\DELTA Z<math> topography is giving a deflection in the xz-plane and measured by the top-bottom detector pair. Lateral forces on the cantilever give both t |
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